Application of the Phase-Retrieval X-Ray Diffractometry to an Ultra-High Spatial Resolution Mapping of SiGe Films near the Absorption Edge of Ge
2001 ◽
Vol 184
(1)
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pp. 145-155
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Keyword(s):
X Ray
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Evaluation of Soft X-ray Laser withIn situImaging Device of High Spatial Resolution ZnO Scintillator
2011 ◽
Vol 50
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pp. 122202
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Keyword(s):
2003 ◽
Vol 79
(4)
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pp. 398-401
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